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Research Article - Journal of Clinical Dentistry and Oral Health (2022) Volume 6, Issue 1
Matrix band used for restoration of class II amalgam cavities in university set up
Aim and Background Dental students commonly face the problem of overhanging proximal margins and unsatisfactory proximal contact points while restoring Class II cavities in posterior teeth. Various matrix band systems are used in dental clinics to avoid such problems and ease of the dentist. The aim of the study was to evaluate the prevalence of use of various types of matrix band in Class II Amalgam restoration in a university setup. Methodology A cross sectional retrospective study of, with a study population of 1567 patients visiting Saveetha Dental College and Hospital who had been treated with Class II Amalgam, the use of different types of matrix bands were noted. The data was tabulated and analysed. SPSS by IBM was used for data analysis The Statistical test used was the Chi Square test. Results The gender prevalence of patients included in the study, which shows that 807 of them were male (51.5%) and 760 of them were female (48.5%). The most common age group was 31 to 40 years of age were 515 patients in the age group of (32.9%). The disto occlusal Class II caries was found to be 801 of the total tooth (51.1%) which is most common of all. 467 of the affected tooth was maxillary premolar (29.8%) which is found to be common tooth for class II caries. 1055 of them used tofflemire for retainer (67.3%) which is the most common retainer and matrix band used. Conclusion From the conducted study we see that males were most commonly affected by class II caries. We also saw that the most common age group was 31 to 40 years of age. Maxillary premolar are the most common tooth to be affected by class II caries. Disto Occlusal caries are common of class II caries. Tofflemire retainer is the standard of matrix band used in the university setup. There is a need to increase the knowledge and uses of ivory retainer as it is easy to use and has a tight contact.
Author(s): Babu V, Deepak S