Journal of Biomedical Imaging and Bioengineering

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N. Guenifi Author

Temperature Reliability study on Double Gate Tunnel Field Effect Transistor

LEA Electronics Department, University Mostefa Benboulaid of Batna 2, Batna (05000) Algeria

Biography:

N. Guenifi   has been involved in many quantitative as well as qualitative studies; but her expertise are mostly related to qualitative and action research.  LEA Electronics Department, University Mostefa Benboulaid of Batna 2, Batna (05000) Algeria

Subjects of specialization: Biologics,Image Processing, Visual Perception, Micro-Biomechanics

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