Temperature Reliability study on Double Gate Tunnel Field Effect Transistor
LEA Electronics Department, University Mostefa Benboulaid of Batna 2, Batna (05000) Algeria
Biography:
N. Guenifi has been involved in many quantitative as well as qualitative studies; but her expertise are mostly related to qualitative and action research. LEA Electronics Department, University Mostefa Benboulaid of Batna 2, Batna (05000) Algeria
Subjects of specialization: Biologics,Image Processing, Visual Perception, Micro-Biomechanics