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Page 16

November 20-21, 2019 | Berlin, Germany

OF EXCELLENCE

IN INTERNATIONAL

MEETINGS

alliedacademies.com

YEARS

ANALYTICAL CHEMISTRY AND

CHROMATOGRAPHY METHODS

2

nd

International Conference on

Analytical Chemistry 2019

MASS ACCURACY OF MULTI-REFLECTING TOFMS

Anatoly Verenchikov

Mass Spectrometry Consulting Ltd., Montenegro

A

nalytical chemistry becomes more and more alert of the importance of mass accuracy in mass spectral

measurements. With development of new data processing algorithms, true specificity and the separation

power of mass spectral measurements is primarily limited by mass accuracy rather than by the resolving power.

Sub-ppmmass accuracy is desired in proteomics for reduced number of incorrect identifications (an increase in

the confidence of hits) and it would extend the mass range and the elemental diversity of compound identifi-

cation in other areas of mass spectral analyses. As demonstrated on GCxGC-MS case [1], the separation capac-

ity of hybrid separation methods improves with mass accuracy. As been shown in [2], accurate mass defects,

in-large, correlate with mobility shifts and in this sense precise mass measurements duplicate the mobility

separations. Currently, commercial high-resolution instruments –time-of-flight MS, ICR FTMS and electrostatic

traps – are just approaching a barrier of sub-ppm mass accuracy. Back in 2006, multi-reflecting time-of-flight

mass spectrometers (MR-TOF) were demonstrated to reach 1 Million resolving power [3] for a narrow mass

range. At full mass range, the resolving power R is limited by the instrument size with typical R=200,000 to

300,000 [4], meaning that mass spectral peaks are 3-5ppm wide. With detected ion fluxes up to 1E+8ion/s, ion

statistics potentially allows reaching low 1ppb mass scatter at sub second spectral acquisition. However, the

true mass accuracy with internal calibration still remains in the order of 0.1ppm (i.e. 100ppb). The presentation

will discuss several already recognized limiting factors: In-spectra ion statistical limit, limiting mass accuracy

at low intensity signals or at fast spectral acquisitions; diversity of not fully resolved isobars from chemical

background systematic curvature and oscillations of mass calibration curve, produced by finite rise time and

oscillations induced on accelerator electrodes: Slow drifts and higher frequency noise of power supplies; Mass

and charge dependent parameters of ion beam in front of MRTOF; Effects of nanoampere currents within inter-

faces; Space charge effects within analyzers and Noise and saturation of the data system. Most of those factors

can be avoided or at least accurately recognized for producing reliable measurement results.

References

1.

Verenchikov et. al, IMSC 2014, MOS01-05

2.

Kozlov

ey.al,

ASMS 2014

3.

Verenchikov

et.al

, Technical Physics, Vol. 50, No. 1, 2005, pp. 82–86.

4.

Verenchikov

et.al

, JASCM, 2017, 6, 1-22.

Anatoly Verenchikov, J Chem Tech App 2019, Volume 3

Journal of Chemical Technology and Applications | Volume 3